Device IC damage influence in no device testing the module was ve_英语解答

Device IC damage influence in no device testing the module was verified through de-processing analysis.no device was caused by device IC damage.

人气：102 ℃　时间：2020-04-23 08:12:22

解答

通过过程分析可以确定集成电路的损坏不会对检测模块造成影响.装置也不会受集成电路的影响.
表达没有错误,就是那个词：deprocessing没怎么听过呢,不过不影响意思的理解